@article {275,
	title = {Parallel algorithms for low-level vision on the homogeneous multiprocessor},
	journal = {Computers \& Electrical Engineering},
	volume = {20},
	year = {1994},
	pages = {51 - 60},
	abstract = {<p>In this work, we present the parallel implementation of three low-level vision algorithms, namely smoothing, histogram generation and edge detection by using the Sobel operator on the Homogeneous Multiprocessor. These algorithms were run on the simulator specifically developed for the Homogeneous Multiprocessor and the simulation experiments were used to establish the performance of these algorithms on the proposed architecture.</p>
},
	keywords = {Computer architecture, image processing, MIMO architecture, Multiprocessing, pattern recognition, vision},
	issn = {0045-7906},
	doi = {https://doi.org/10.1016/0045-7906(94)90006-X},
	url = {http://www.sciencedirect.com/science/article/pii/004579069490006X},
	author = {Ram Dantu and Dimopoulos, Nikitas and Li, Kinfu and Patel, Rajni and Al-Khalili, Asim}
}
@conference {284,
	title = {A micro-manipulator vision in IC Manufacturing},
	booktitle = {Proceedings. 1988 IEEE International Conference on Robotics and Automation},
	year = {1988},
	month = {Apr},
	abstract = {<p>An overview is presented of a micromanipulator vision system for use in automating various functions during the testing of a wafer for semiconducting parameters and inspection of VLSI circuits. Positioning the probe and touching a test pad are the chief concern of the work desired. A brief description of the experimental setup is given. The image processing techniques used in identifying and controlling the location of various components such as the probes and the test pads are discussed. The vision modules and an expert system using hierarchical plan generation to control the sequence of plans are included</p>
},
	keywords = {Automatic testing, Circuit testing, computer vision, computer vision module, computerised pattern recognition, expert system, expert systems, IC Manufacturing, image processing, industrial robots, Inspection, integrated circuit manufacture, integrated circuit testing, Machine vision, Manufacturing, micromanipulator vision, Micromanipulators, Probes, robots, Semiconductivity, Semiconductor device manufacture, Semiconductor device testing, System testing, test pads, VLSI, wafer testing},
	doi = {10.1109/ROBOT.1988.12271},
	author = {Ram Dantu and Dimopoulos, Nikitas and Patel, Rajni and Al-Khalili, Asim}
}
