@article {31,
	title = {Estimation of Defects Based on Defect Decay Model: ED^\{3\}M},
	journal = {IEEE Transactions on Software Engineering},
	volume = {34},
	year = {2008},
	pages = {336 - 356},
	abstract = {<p>An accurate prediction of the number of defects in a software product during system testing contributes not only to the management of the system testing process but also to the estimation of the product{\textquoteright}s required maintenance. Here, a new approach called ED<sup>3</sup>M is presented that computes an estimate of the total number of defects in an ongoing testing process. ED<sup>3</sup>M is based on estimation theory. Unlike many existing approaches the technique presented here does not depend on historical data from previous projects or any assumptions about the requirements and/or testers{\textquoteright} productivity. It is a completely automated approach that relies only on the data collected during an ongoing testing process. This is a key advantage of the ED<sup>3</sup>M approach, as it makes it widely applicable in different testing environments. Here, the ED<sup>3</sup>M approach has been evaluated using five data sets from large industrial projects and two data sets from the literature. In addition, a performance analysis has been conducted using simulated data sets to explore its behavior using different models for the input data. The results are very promising; they indicate the ED<sup>3</sup>M approach provides accurate estimates with as fast or better convergence time in comparison to well-known alternative techniques, while only using defect data as the input.</p>
},
	keywords = {Costs, defect decay model, defect estimation, Defect prediction, estimation theory, Inspection, Metrics/Measurement, Phase estimation, Productivity, program testing, Programming, Software maintenance, software metrics, software product, Software systems, Software testing, Statistical methods, System testing, system testing process, Testing and Debugging},
	doi = {10.1109/TSE.2008.23},
	author = {Haider, Syed and Cangussu, Jo{\~a}o and Cooper, Kendra and Ram Dantu}
}
